Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductors

by Gogotsi, Y. G., Domnich, V., Dub, S. N., Kailer, A. and Nickel, K. G.
Reference:
Y. G. Gogotsi, V. Domnich, S. N. Dub, A. Kailer, and K. G. Nickel, "Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductors", Journal of Materials Research, vol. 15, no. 4, 2000, pp. 871.
Bibtex Entry:
@article{47,
   author = {Gogotsi, Y. G. and Domnich, V. and Dub, S. N. and Kailer, A. and Nickel, K. G.},
   title = {Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductors},
   journal = {Journal of Materials Research},
   volume = {15},
   number = {4},
   pages = {871},
   ISSN = {0884-2914},
   DOI = {10.1557/jmr.2000.0124},
   year = {2000},
   date= {04/01}
   type = {Journal Article},
   url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/47.pdf
}

Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductors