by Ge, D. B., Domnich, V. and Gogotsi, Y.
Reference:
D. B. Ge, V. Domnich, and Y. Gogotsi, "High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation", Journal of Applied Physics, vol. 93, no. 5, 2003, pp. 2418.
Bibtex Entry:
@article{72,
author = {Ge, D. B. and Domnich, V. and Gogotsi, Y.},
title = {High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation},
journal = {Journal of Applied Physics},
volume = {93},
number = {5},
pages = {2418},
ISSN = {0021-8979},
DOI = {10.1063/1.1539916},
year = {2003},
date= {03/01}
type = {Journal Article},
url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/72.pdf
}
High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation
